The Bruker Dimension Icon AFM (Atomic Force Microscope) is a very high resolution scanning microscope used in scanning microscopy (SPM) which produces three dimensional images. It is used for nanoscale surface topography, nano-mechanical, nano-electircal, and nano-scale chemical mapping, and morphology measurement.
Nanoscope SPM control station and analysis software
Dimension Fastscan AFM System
210 mm vacuum sample chuck taking samples of <210 mm diameter <15 mm thick
Peak Force QNM Software
Peak Force TUNA Software
Regular contact mode and tapping mode (f= 300 kHz)
Multiple AFM modes, including Lateral Force Microscopy, Electric Force Microscopy, Piezoresponse Microscopy, Force Spectroscopy, and Phaselmaging
Icon Scanner for ultra-low noise, high accuracy scanning as an alternative to the Fastscan system
30” Monitor
Acoustic and Vibration Isolation Enclosure
Nanoscale surface topography
Nano-mechanical, nano-electrical, and nano-scale chemical mapping
Semiconductors
Optics
Polymers
Process Manager
+1 (773) 834-4978
Reserve this tool with the Online Tool Manager.
Tier 0
